DocumentCode :
1474535
Title :
A Mathematical Formalism for Surge Generator Correlation
Author :
Toh, Tze-Chuen
Author_Institution :
Lexmark Int., Lexington, MA, USA
Volume :
53
Issue :
2
fYear :
2011
fDate :
5/1/2011 12:00:00 AM
Firstpage :
547
Lastpage :
551
Abstract :
The definitions for surge correlation and surge compatibility between two calibrated surge generators are established in this paper. The definitions lead naturally to the construction of optimal surge testing policies. It is also sketched that surge is harsher on a platform that is fully loaded. Finally, the criterion for reducing unnecessary surge testing is derived.
Keywords :
electromagnetic compatibility; surges; transient analysis; electromagnetic compatibility; mathematical formalism; optimal surge testing policies; surge compatibility; surge generator correlation; transient analysis; Correlation; Generators; Impedance; Power supplies; Silicon; Surges; Voltage measurement; Electromagnetic compatibility (EMC); measurement; standards; surges; transient analysis;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.2011.2116794
Filename :
5733409
Link To Document :
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