• DocumentCode
    1474535
  • Title

    A Mathematical Formalism for Surge Generator Correlation

  • Author

    Toh, Tze-Chuen

  • Author_Institution
    Lexmark Int., Lexington, MA, USA
  • Volume
    53
  • Issue
    2
  • fYear
    2011
  • fDate
    5/1/2011 12:00:00 AM
  • Firstpage
    547
  • Lastpage
    551
  • Abstract
    The definitions for surge correlation and surge compatibility between two calibrated surge generators are established in this paper. The definitions lead naturally to the construction of optimal surge testing policies. It is also sketched that surge is harsher on a platform that is fully loaded. Finally, the criterion for reducing unnecessary surge testing is derived.
  • Keywords
    electromagnetic compatibility; surges; transient analysis; electromagnetic compatibility; mathematical formalism; optimal surge testing policies; surge compatibility; surge generator correlation; transient analysis; Correlation; Generators; Impedance; Power supplies; Silicon; Surges; Voltage measurement; Electromagnetic compatibility (EMC); measurement; standards; surges; transient analysis;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2011.2116794
  • Filename
    5733409