DocumentCode :
1474545
Title :
Normal and superconductor coplanar waveguides with 100 nm line width
Author :
Wuensch, S. ; Benz, G. ; Crocoll, E. ; Fitsilis, M. ; Neuhaus, M. ; Scherer, T.A. ; Jutzi, W.
Author_Institution :
Inst. fuer Elektrotech. Grundlagen der Inf., Karlsruhe Univ., Germany
Volume :
11
Issue :
1
fYear :
2001
fDate :
3/1/2001 12:00:00 AM
Firstpage :
115
Lastpage :
118
Abstract :
High speed high package density integrated circuits require a hierarchy of interconnections with small and large cross sections where the smallest linewidth approaches the 100 nm range. Attenuation and delay of superconducting interconnections down to the order of the London penetration depth for 50 Ω and higher characteristic impedances are compared with normal conducting ones near 20 GHz. Symmetrical coplanar waveguides with polycrystalline aluminum and niobium and c-axis oriented Y1Ba2Cu3O 7-δ on substrates with a dielectric constant of about 12 are chosen to demonstrate basic properties mainly at 77 K and 4.2 K. Simulated quality factors are checked by measurements down to 1000 nm line width
Keywords :
coplanar waveguides; microstrip lines; penetration depth (superconductivity); superconducting interconnections; superconducting microwave devices; 100 nm; 100 nm line width; 20 GHz; 4.2 K; 50 ohm; 77 K; Al; London penetration depth; Nb; YBa2Cu3O7; high speed high package density integrated circuits; interconnections; normal coplanar waveguides; superconducting interconnections; superconductor coplanar waveguides; Aluminum; Attenuation; Coplanar waveguides; Delay; High speed integrated circuits; Impedance; Integrated circuit interconnections; Integrated circuit packaging; Niobium; Superconducting integrated circuits;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.919298
Filename :
919298
Link To Document :
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