• DocumentCode
    1474545
  • Title

    Normal and superconductor coplanar waveguides with 100 nm line width

  • Author

    Wuensch, S. ; Benz, G. ; Crocoll, E. ; Fitsilis, M. ; Neuhaus, M. ; Scherer, T.A. ; Jutzi, W.

  • Author_Institution
    Inst. fuer Elektrotech. Grundlagen der Inf., Karlsruhe Univ., Germany
  • Volume
    11
  • Issue
    1
  • fYear
    2001
  • fDate
    3/1/2001 12:00:00 AM
  • Firstpage
    115
  • Lastpage
    118
  • Abstract
    High speed high package density integrated circuits require a hierarchy of interconnections with small and large cross sections where the smallest linewidth approaches the 100 nm range. Attenuation and delay of superconducting interconnections down to the order of the London penetration depth for 50 Ω and higher characteristic impedances are compared with normal conducting ones near 20 GHz. Symmetrical coplanar waveguides with polycrystalline aluminum and niobium and c-axis oriented Y1Ba2Cu3O 7-δ on substrates with a dielectric constant of about 12 are chosen to demonstrate basic properties mainly at 77 K and 4.2 K. Simulated quality factors are checked by measurements down to 1000 nm line width
  • Keywords
    coplanar waveguides; microstrip lines; penetration depth (superconductivity); superconducting interconnections; superconducting microwave devices; 100 nm; 100 nm line width; 20 GHz; 4.2 K; 50 ohm; 77 K; Al; London penetration depth; Nb; YBa2Cu3O7; high speed high package density integrated circuits; interconnections; normal coplanar waveguides; superconducting interconnections; superconductor coplanar waveguides; Aluminum; Attenuation; Coplanar waveguides; Delay; High speed integrated circuits; Impedance; Integrated circuit interconnections; Integrated circuit packaging; Niobium; Superconducting integrated circuits;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.919298
  • Filename
    919298