DocumentCode
1474545
Title
Normal and superconductor coplanar waveguides with 100 nm line width
Author
Wuensch, S. ; Benz, G. ; Crocoll, E. ; Fitsilis, M. ; Neuhaus, M. ; Scherer, T.A. ; Jutzi, W.
Author_Institution
Inst. fuer Elektrotech. Grundlagen der Inf., Karlsruhe Univ., Germany
Volume
11
Issue
1
fYear
2001
fDate
3/1/2001 12:00:00 AM
Firstpage
115
Lastpage
118
Abstract
High speed high package density integrated circuits require a hierarchy of interconnections with small and large cross sections where the smallest linewidth approaches the 100 nm range. Attenuation and delay of superconducting interconnections down to the order of the London penetration depth for 50 Ω and higher characteristic impedances are compared with normal conducting ones near 20 GHz. Symmetrical coplanar waveguides with polycrystalline aluminum and niobium and c-axis oriented Y1Ba2Cu3O 7-δ on substrates with a dielectric constant of about 12 are chosen to demonstrate basic properties mainly at 77 K and 4.2 K. Simulated quality factors are checked by measurements down to 1000 nm line width
Keywords
coplanar waveguides; microstrip lines; penetration depth (superconductivity); superconducting interconnections; superconducting microwave devices; 100 nm; 100 nm line width; 20 GHz; 4.2 K; 50 ohm; 77 K; Al; London penetration depth; Nb; YBa2Cu3O7; high speed high package density integrated circuits; interconnections; normal coplanar waveguides; superconducting interconnections; superconductor coplanar waveguides; Aluminum; Attenuation; Coplanar waveguides; Delay; High speed integrated circuits; Impedance; Integrated circuit interconnections; Integrated circuit packaging; Niobium; Superconducting integrated circuits;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.919298
Filename
919298
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