• DocumentCode
    1474555
  • Title

    Characterization of X-band filter of double-sided Y-Ba-Cu-O film on MgO substrate

  • Author

    Suzuki, Katsumi ; Hasegawa, Norio ; Nakada, Hajime ; Suzuki, Takeo ; Enomoto, Youichi

  • Volume
    11
  • Issue
    1
  • fYear
    2001
  • fDate
    3/1/2001 12:00:00 AM
  • Firstpage
    119
  • Lastpage
    122
  • Abstract
    We investigated the pulsed laser deposition process of double-sided Y-Ba-Cu-O thin films on MgO substrates, the critical current density (Jc) distribution and the microwave surface impedance (Rs) of the films, and the power handling capability by third-order intermodulation distortion (IMD3) measurements using 40 W high power microwave measurement system. A clean flat MgO surface was important for Y-Ba-Cu-O deposition and successfully obtained by three-hour pre-annealing at 1000°C in air. To confirm the film process, we designed, fabricated and measured the 11 GHz band-pass 7-pole Y-Ba-Cu-O filter. We also found that the outskirts of the Y-Ba-Cu-O film on MgO substrate were particularly important in Jc quality because the biggest microwave power in filter circuit is allocated in the outskirts of Y-Ba-Cu-O film area
  • Keywords
    annealing; barium compounds; critical current density (superconductivity); high-temperature superconductors; microwave filters; pulsed laser deposition; superconducting microwave devices; superconducting thin films; yttrium compounds; 1000 C; 11 GHz; 40 W; MgO; MgO substrate; X-band filter; YBa2Cu3O7; critical current density; double-sided Y-Ba-Cu-O film; high temperature superconductor; microwave surface impedance; power handling capability; pulsed laser deposition process; third-order intermodulation distortion; three-hour pre-annealing; Current measurement; Density measurement; Distortion measurement; Impedance measurement; Microwave filters; Pulse measurements; Pulsed laser deposition; Substrates; Surface cleaning; Yttrium barium copper oxide;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.919299
  • Filename
    919299