Title :
Fabrication of interface-controlled Josephson junctions using Sr 2AlTaO6 insulating layers
Author :
Sung, G.Y. ; Kim, JunHo
Author_Institution :
Electron. & Telecommun. Res. Inst., Taejon, South Korea
fDate :
3/1/2001 12:00:00 AM
Abstract :
We fabricated ramp-edge Josephson junctions with barriers formed by interface treatments instead of epitaxially grown barrier layers. A low-dielectric Sr3AlTaO6 (SAT) layer was used as an ion-milling mask as well as an insulating layer for the ramp-edge junctions. An ion-milled YBa2Cu3O7-x (YBCO)-edge surface was not exposed to solvent through all fabrication procedures. The barriers were produced by structural modification at the edge of the YBCO base electrode using high energy ion-beam treatment prior to deposition of the YBCO counter electrode. We investigated the effects of high energy ion-beam treatment, annealing, and counter electrode deposition temperature on the characteristics of the interface-controlled Josephson junctions. The junction parameters such as Tc, Ic, RN were measured and discussed in relation to the barrier layer depending on the process parameters
Keywords :
Josephson effect; aluminium compounds; annealing; barium compounds; critical currents; high-temperature superconductors; insulating thin films; ion beam applications; strontium compounds; superconducting junction devices; superconducting thin films; superconducting transition temperature; yttrium compounds; Sr2AlTaO6 insulating layers; YBCO counter electrode; YBa2Cu3O7; YBa2Cu3O7-Sr2AlTaO 6; YBaCuO interface-controlled Josephson junctions; annealing; barrier layer; counter electrode deposition temperature; high energy ion-beam treatment; interface treatment; ion-milled YBa2Cu3O7-x-edge surface; ion-milling mask; junction parameters; low-dielectric Sr3AlTaO6 layer; ramp-edge Josephson junctions; structural modification; Annealing; Counting circuits; Electrodes; Fabrication; Insulation; Josephson junctions; Solvents; Strontium; Surface treatment; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
