Title :
On-chip high-frequency diagnostic of RSFQ logic cells
Author :
Febvre, Pascal ; Berthet, Jean-Claude ; Ney, David ; Roussy, Agnes ; Tao, Junwu ; Angénieux, Gilbert ; Hadacek, Nicolas ; Villégier, Jean-Claude
Author_Institution :
Lab. d´´Hyperfrequences et Caracterisation, Savoie Univ., Chambery, France
fDate :
3/1/2001 12:00:00 AM
Abstract :
Hilbert Transform spectroscopy is described as a method to analyze the spectrum of pulse trains generated by RSFQ circuits. Simulations are carried out using parameters appropriate for NbN Josephson junctions for both generation and detection of SFQ pulse trains. It is shown that the pulse shape along with the pulse train repetition rate can be extracted through the use of a Josephson junction, used as a spectrometer, and located on-chip with the RSFQ circuit to test
Keywords :
Hilbert transforms; logic testing; niobium compounds; superconducting device testing; superconducting logic circuits; Hilbert transform spectroscopy; NbN; NbN Josephson junction; RSFQ logic circuit; on-chip high-frequency diagnosis; pulse shape; pulse train repetition rate; Circuit testing; Frequency; Josephson junctions; Logic; Performance evaluation; Pulse circuits; Pulse generation; Pulse measurements; Semiconductor device measurement; Spectroscopy;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
