Title :
Contacts on single crystals grown by liquid phase epitaxy
Author :
Enomoto, Youichi ; Suzuki, Hideo ; Hoshi, Saburo ; Izumi, Teruo ; Shiohara, Yuh
Author_Institution :
ISTEC-SRL, Chiba, Japan
fDate :
3/1/2001 12:00:00 AM
Abstract :
We have fabricated a contact with a small area on a YBa2Cu3O7-y (YBCO) ground plane grown by Liquid Phase Epitaxy (LPE). The contact has a ramped edge structure, which directly connects CuO2 planes between the ground plane and lines. After deposition of NdBa2Cu3O7-x (NBCO) films used for lines, no deterioration is observed in AFM image on the ramped edge in spite of its higher deposition temperature than that of the YBCO thin film. This shows high crystal quality of the YBCO film grown by LPE. Flux flow type current-voltage characteristics are observed with critical current density of 5×104 A/cm2 at 47 K. XRD shows strain caused by lattice mismatch along the boundaries between NBCO and YBCO
Keywords :
X-ray diffraction; atomic force microscopy; barium compounds; critical current density (superconductivity); flux flow; high-temperature superconductors; liquid phase epitaxial growth; neodymium compounds; superconducting epitaxial layers; yttrium compounds; NBCO thin film; X-ray diffraction; YBCO thin film; YBa2Cu3O7-NdBa2Cu 3O7; atomic force microscopy; critical current density; current-voltage characteristics; flux flow; ground plane-line contact; lattice mismatch strain; liquid phase epitaxy; multilayer structure; ramp edge junction; single crystal; Capacitive sensors; Critical current density; Current-voltage characteristics; Epitaxial growth; Land surface temperature; Lattices; Liquid crystals; Sputtering; X-ray scattering; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
