Title :
Rectangular waveguide characterization for reflectometry
Author :
Hunter, John D. ; Somlo, P.I.
Author_Institution :
Nat. Meas. Lab., Lindfield, NSW, Australia
fDate :
9/1/1988 12:00:00 AM
Abstract :
Simple first-order correction formulas are developed to describe the combined effect of wall distortion and wall loss on the propagation constant and normalized impedance of nominally rectangular waveguides intended for use in reflectometry. A simple method of measuring the propagation constant at a single frequency is described, resulting in practical advantages in characterization of the waveguide at other frequencies
Keywords :
calibration; microwave reflectometry; rectangular waveguides; first-order correction formulas; microwave measurement; nominally rectangular waveguides; normalized impedance; propagation constant; reflectometry; wall distortion; wall loss; Calibration; Flanges; Frequency measurement; Impedance; Propagation constant; Propagation losses; Rectangular waveguides; Reflection; Reflectometry; Waveguide junctions;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
