• DocumentCode
    1474881
  • Title

    CNT-Based MEMS/NEMS Gas Ionizers for Portable Mass Spectrometry Applications

  • Author

    Velásquez-García, Luis Fernando ; Gassend, Blaise Laurent Patrick ; Akinwande, Akintunde Ibitayo

  • Author_Institution
    Microsyst. Technol. Labs., Massachusetts Inst. of Technol., Cambridge, MA, USA
  • Volume
    19
  • Issue
    3
  • fYear
    2010
  • fDate
    6/1/2010 12:00:00 AM
  • Firstpage
    484
  • Lastpage
    493
  • Abstract
    We report the fabrication and experimental characterization of a carbon nanotube (CNT)-based MEMS/NEMS electron impact gas ionizer with an integrated extractor gate for portable mass spectrometry. The ionizer achieves low-voltage ionization using sparse forests of plasma-enhanced chemical-vapor-deposited CNTs as field emitters and a proximal extractor grid with apertures aligned to the CNT forests to facilitate electron transmission. The extractor gate is integrated to the ionizer using a high-voltage MEMS packaging technology based on Si springs defined by deep reactive ion etching. The ionizer also includes a high-aspect-ratio silicon structure (??foam) that facilitates sparse CNT growth and also enables uniform current emission. The devices were tested as field emitters in high vacuum (10-8 torr) and as electron impact ionizers using argon at pressures of up to 21 mtorr. The experimental data show that the MEMS extractor gate transmits up to 66% of the emitted current and that the ionizers are able to produce up to 0.139 mA of ion current with up to 19% ionization efficiency while consuming 0.39 W.
  • Keywords
    carbon nanotubes; electron impact ionisation; mass spectroscopy; microfabrication; micromechanical devices; nanoelectromechanical devices; plasma CVD; CNT-based MEMS electron impact gas ionizer; CNT-based NEMS electron impact gas ionizer; MEMS extractor gate; argon; carbon nanotube; deep reactive ion etching; electron transmission; fabrication characterization; field emitters; high-aspect-ratio silicon structure; high-voltage MEMS packaging technology; integrated extractor gate; low-voltage ionization; plasma-enhanced chemical-vapor-deposited CNT; portable mass spectrometry applications; power 0.39 W; proximal extractor grid; sparse CNT growth; 3-D MEMS packaging; Carbon nanotubes (CNTs); deep reactive ion etching (DRIE); electron impact ionization; field emission; gas ionizer; portable mass spectrometry (MS);
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/JMEMS.2010.2045639
  • Filename
    5451109