Title :
Spread of critical currents in thin-film YBa2Cu3 O7-x bicrystal junctions
Author :
Shadrin, Pavel ; Divin, Yuri
Author_Institution :
Inst. of Solid-State Phys., Juelich Res. Centre, Juelich, Germany
fDate :
3/1/2001 12:00:00 AM
Abstract :
A spread of the critical currents in a series array of up to 100 YBa2Cu3O7-x bicrystal junctions has been studied by Laser Scanning Microscopy. The values of the critical current Ic of individual junctions in the array have been obtained by focusing a laser beam on each junction and measuring the current at which the maximum laser-induced voltage response ΛV on the array has appeared. The distribution of critical currents in logarithmic scale was close to a Gaussian one. The Ic-spread has been found to increase with the increase of misorientation angle of bicrystal substrate and the decrease of the width of the junctions in the array
Keywords :
Josephson effect; barium compounds; bicrystals; critical currents; high-temperature superconductors; superconducting arrays; superconducting thin films; yttrium compounds; YBa2Cu3O7-x thin film bicrystal junction; YBa2Cu3O7; critical current; grain boundary Josephson junction; laser scanning microscopy; local probing; misorientation angle; series array; Atomic force microscopy; Critical current; Grain boundaries; High temperature superconductors; Optical arrays; Optical device fabrication; Semiconductor laser arrays; Substrates; Surfaces; Transistors;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
