Title :
Spectral analysis of a sampling optical time-domain reflectometer
Author :
Ibrahim, Magdym ; Ahmed, M.H.
Author_Institution :
Dept. of Electron. & Comput. Eng., Ain-Shams Univ., Cairo, Egypt
fDate :
9/1/1988 12:00:00 AM
Abstract :
A spectral analysis is presented for the backscatter signal of optical time-domain reflectometers (OTDR). Periodic spatial fluctuations in the fiber attenuation produce modulation sidebands in the frequency spectrum of the backscatter signal. Applying the sampling technique to OTDR leads to a considerable improvement of the signal-to-noise ratio (S/N) due to spectrum compression, as a tradeoff with the measurement time. It gives a performance equivalent to digital averaging. Design examples are given at wavelengths of 0.85, 1.3, and 1.55 μm. A practical setup of a sampling OTDR is described
Keywords :
backscatter; optical fibres; optical testing; signal processing; spectral analysis; time-domain reflectometry; 0.85 micron; 1.3 micron; 1.55 micron; backscatter signal; digital averaging; fiber attenuation; modulation sidebands; optical testing; sampling optical time-domain reflectometer; signal-to-noise ratio; spatial fluctuations; spectral analysis; spectrum compression; Backscatter; Fluctuations; Frequency; Optical attenuators; Optical modulation; Sampling methods; Signal to noise ratio; Spectral analysis; Time domain analysis; Time measurement;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
