DocumentCode :
1475347
Title :
A novel self-biased linear silicon drift detector
Author :
Corsi, F. ; De Venuto, D. ; Gramegna, G. ; Marzocca, C. ; Vacchi, A. ; Bonvicini, V. ; Burger, P. ; Rashevsky, A. ; Zampa, N.
Author_Institution :
Dipt. di Elettrotecnica ed Elettronica, Ist. Nazionale di Fisica Nucl., Bari, Italy
Volume :
46
Issue :
1
fYear :
1999
fDate :
2/1/1999 12:00:00 AM
Firstpage :
19
Lastpage :
27
Abstract :
A novel linear silicon drift detector (SDD) is proposed in which the proper potential profile is established by the voltage drop along a unique p+ cathode implanted across the surfaces. This p+ implant, arranged in a zigzag shape, acts at the same time as voltage divider and field cathode and allows us to increase the sensitive area, improving also the uniformity of the thermal distribution and thus minimizing the fluctuation of the electron mobility on the sensitive zone of the SDD. The perturbations of the drift field due to the asymmetry of the strips constituting the zigzag cathode have been evaluated by solving analytically Poisson´s equation for a simplified model of the structure. Three-dimensional numerical simulations have been carried out to prove the negligible amount of the perturbation and the effectiveness of the proposed structure. Based on this principle, a prototype has been manufactured at Canberra Semiconductor Company. Dynamic measurements of the time-of-flight of an injected charge prove that the linearity of the prototype and the drift uniformity in the anode direction are very high
Keywords :
Poisson equation; electric potential; electron mobility; numerical analysis; silicon radiation detectors; Poisson´s equation; Si; drift field; electron mobility; field cathode; proper potential profile; self-biased linear silicon drift detector; thermal distribution; voltage divider; zigzag shape; Cathodes; Detectors; Electron mobility; Fluctuations; Implants; Prototypes; Shape; Silicon; Strips; Voltage;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.747763
Filename :
747763
Link To Document :
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