Heavy ion linear energy transfer measurements during single event upset testing of electronic devices

A heavy ion beam diagnostic system installed at the Brookhaven Single Event Upset Test Facility is described. Calibration of the system with the help of a-particles, essential for linear energy transfer (LET) measurements, is discussed. Measured LET values for 20 different ions, including ⁷Li, ⁹B, ¹²C, ¹⁶O, ¹⁹F, ²⁸Si, ³²S, ³⁵Cl, ⁴⁰Ca, ⁴⁵Sc, ⁴⁸Ti, ⁵⁶Fe, ⁵⁸Ni, ⁶³Cu, ⁷⁴Ge, ⁷⁹Br, ¹⁰⁷Ag, ¹²⁷I, ¹⁹⁷Au, and ²³⁵U, with energies between 0.5 and 8.5 MeV/AMU but not exceeding 400 MeV for the heaviest ions, are presented in both graphical and numerical forms. Results are compared to predictions of the TRIM-90 simulation program, with an average difference between the measured and calculated values of 2±6%