DocumentCode :
1475556
Title :
ECO Timing Optimization Using Spare Cells and Technology Remapping
Author :
Ho, Kuan-Hsien ; Chen, Yen-Pin ; Fang, Jia-Wei ; Chang, Yao-Wen
Author_Institution :
Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Volume :
29
Issue :
5
fYear :
2010
fDate :
5/1/2010 12:00:00 AM
Firstpage :
697
Lastpage :
710
Abstract :
We introduce in this paper a new problem of post-mask engineering change order (ECO) timing optimization using spare-cell rewiring and present a two-phase framework for this problem. Spare-cell rewiring is a popular technique for incremental timing optimization and/or functional change after the placement stage. The spare-cell rewiring problem is very challenging because of its dynamic wiring cost nature for selecting a spare cell, while the existing related problems consider only static wiring cost: once a standard cell is placed, its physical location is fixed and so is its wiring cost. For the spare-cell rewiring problem, each rewiring could make some spare cells become ordinary standard cells and some standard cells become new spare cells simultaneously. As a result, the wiring cost becomes dynamic and further complicates the optimization process. For the addressed problem, we present a two-phase framework of 1) buffer insertion and gate sizing followed by 2) technology remapping. For Phase 1, we present a dynamic programming algorithm considering the dynamic cost, called dynamic cost programming, for the ECO timing optimization with spare cells. Without loss of solution optimality, we further present an effective pruning method by selecting spare cells only inside an essential bounding polygon to reduce the solution space. For those ECO timing paths that cannot be fixed during Phase 1, we apply technology remapping on the spare cells to restructure the circuit to fix the timing violations. The whole framework is integrated into a commercial design flow. Experimental results based on five industry benchmarks show that our method is very effective and efficient in fixing the timing violations of ECO paths.
Keywords :
dynamic programming; masks; ECO timing optimization; dynamic cost programming; dynamic programming algorithm; dynamic wiring cost; effective pruning method; incremental timing optimization; post-mask engineering change order timing optimization; spare-cell rewiring problem; static wiring cost; technology remapping; Computer bugs; Cost function; Design optimization; Dynamic programming; Heuristic algorithms; Integrated circuit technology; Space technology; Time to market; Timing; Wiring; Engineering change order (ECO); gate sizing; physical design; spare cells; technology remapping; timing optimization;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2010.2043573
Filename :
5452097
Link To Document :
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