DocumentCode :
1475739
Title :
Development of practical soft X-ray spectrometers
Author :
Brammertz, G. ; Verhoeve, P. ; Peacock, A. ; Martin, D. ; Rando, N. ; den Hartog, R. ; Goldie, D.J.
Author_Institution :
Div. of Astrophys., Eur. Space Res. & Technol. Centre, Noordwijk, Netherlands
Volume :
11
Issue :
1
fYear :
2001
fDate :
3/1/2001 12:00:00 AM
Firstpage :
828
Lastpage :
831
Abstract :
Cryogenic soft X-ray imaging spectrometers are currently being developed for applications in the fields of astronomy and material sciences. In this paper we present experiments on optimized single devices, which show measured energy resolutions of 4.6 eV, 8.1 eV and 20.5 eV at 525 eV, 1.5 keV and 6 keV respectively. These energy resolutions combined with a quantum efficiency of more than 40% in the energy range from 0.5 to 2 keV together with a count rate capability of 15 kHz demonstrate the overall good performance of single Superconducting Tunnel junctions (STJs). Assembling these optimized single devices in a matrix read-out would provide the practical basis for a soft X-ray imaging spectrometer
Keywords :
X-ray imaging; X-ray spectrometers; superconducting junction devices; superconductive tunnelling; 0.5 to 6 keV; 15 kHz; 40 percent; count rate; cryogenic soft X-ray imaging spectrometer; design optimization; energy resolution; matrix readout; quantum efficiency; single device; superconducting tunnel junction; Assembly; Energy resolution; Insulation; Josephson junctions; Niobium; Optical imaging; Spectroscopy; Superconducting epitaxial layers; Superconducting films; X-ray imaging;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.919472
Filename :
919472
Link To Document :
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