DocumentCode :
1475754
Title :
Full vector analysis of two-dimensional angled and coated optical waveguide facets
Author :
Sewell, P. ; Reed, M. ; Benson, T.M. ; Kendall, P.C.
Author_Institution :
Dept. of Electr. & Electron. Eng., Nottingham Univ., UK
Volume :
33
Issue :
12
fYear :
1997
fDate :
12/1/1997 12:00:00 AM
Firstpage :
2311
Lastpage :
2318
Abstract :
We analyze the important problem of scattering from two-dimensional (2-D) optical waveguide facets, including the effects of both antireflection coatings and facet angle. The facet is allowed to be angled in both vertical and horizontal planes, necessitating a fully vectorial approach to model correctly the polarization coupling that occurs. To achieve this, the highly efficient Free Space Radiation Mode method has been extended to the general vector case, yielding novel expressions for both the reflectivity and the coupling coefficients which can be rapidly evaluated on a desktop PC for a wide variety of practical structures. Results are presented for both angled, coated and coated angled facets. Full field profiles, also available from the approach, are presented and provide useful design information and aids to understanding
Keywords :
antireflection coatings; light scattering; optical films; optical waveguide theory; rectangular waveguides; reflectivity; ridge waveguides; simulation; angled facets; antireflection coatings; coated angled facets; coated facets; coupling coefficients; design information; desktop PC; facet angle; free space radiation mode method; full field profiles; fully vectorial approach; general vector case; horizontal planes; novel expressions; optical waveguide facets; polarization coupling; practical structures; reflectivity; vertical planes; Coatings; Electromagnetic waveguides; Laser modes; Optical polarization; Optical scattering; Optical waveguides; Reflectivity; Semiconductor lasers; Semiconductor optical amplifiers; Waveguide lasers;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.644115
Filename :
644115
Link To Document :
بازگشت