Title :
Line-splitting in high-resolution superconducting tunnel junction EUV detectors
Author :
Friedrich, Stephan ; Hiller, Lawrence J. ; Cunningham, Mark F. ; Labov, Simon E.
Author_Institution :
Lawrence Berkeley Lab., CA, USA
fDate :
3/1/2001 12:00:00 AM
Abstract :
We have developed high-resolution Nb-Al-AlOx-Al-Nb tunnel junction extreme ultra-violet (EUV) detectors. In the energy range between 25 and 70 eV, we have measured an energy resolution of 2.2 eV full-width at half maximum (FWHM). The energy resolution degrades significantly in the energy range between ≈80 and ≈230 eV where the Nb absorber is partially transparent and some of the photons are absorbed in the Al trap layers. We have for the first time observed a distinctly different response for photons absorbed in the Nb and the Al layer of the same junction electrode. We have modeled this effect with Monte-Carlo simulations of the charge generation process in superconducting multilayers
Keywords :
Monte Carlo methods; aluminium; aluminium compounds; niobium; superconducting junction devices; superconductive tunnelling; ultraviolet detectors; 25 to 230 eV; Monte Carlo simulation; Nb-Al-AlO-Al-Nb; Nb-Al-AlOx-Al-Nb superconducting tunnel junction; aluminium trapping layer; charge generation; energy resolution; extreme ultraviolet detector; line splitting; niobium absorber; superconducting multilayer; Degradation; Detectors; Electrodes; Energy measurement; Energy resolution; Josephson junctions; Niobium; Nonhomogeneous media; Superconducting epitaxial layers; Superconducting photodetectors;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
