DocumentCode
1475957
Title
Silicon microstrip electronics operating with 20 ns FWHM signals
Author
Kononenko, W. ; Newcomer, F.M. ; Selove, W. ; Van Berg, R.
Author_Institution
Pennsylvania Univ., Philadelphia, PA, USA
Volume
37
Issue
3
fYear
1990
fDate
6/1/1990 12:00:00 AM
Firstpage
1102
Lastpage
1115
Abstract
For experiment E771 at Fermilab, semicustom integrated circuit (IC) preamplifiers and discriminators have been designed to operate at near single-bucket speed, i.e. to give signals, from a silicon microstrip detector (SMD), shaped to 15 or 20 ns FWHM. Measurements of signal size, signal-to-noise ratio (SNR), and noise rate and signal efficiency versus discriminator threshold setting were made. The test setup used an SMD plane 300-μm thick with 50-μm strips and the prototype ICs produced for experiment E771. Signals were produced by near-relativistic beta rays. The test setup had somewhat larger detector capacitance (C d≈25 pF) than the final experiment detector will have. For tracks passing through the SMD plane nearly perpendicularly, good efficiency was found at acceptable noise rates. When the signal comes almost entirely from a single strip, the SNR is about eight to one. Under these conditions, when the discriminator threshold is set to give about 0.001 to 0.002 noise hits per strip per trigger, the latching efficiency is above 95%. For tracks at an appreciable angle from perpendicular, the deposited charge is shared between strips. For tracks with 60% of the charge or more in a single strip, the efficiency is well over 90%
Keywords
beta-ray detection and measurement; discriminators; nuclear electronics; preamplifiers; semiconductor counters; 15 ns; 20 ns; 25 pF; Si microstrip detector; detector capacitance; discriminator threshold; discriminators; latching efficiency; noise rate; preamplifiers; signal efficiency; signal size; signal-to-noise ratio; Application specific integrated circuits; Detectors; Microstrip; Noise measurement; Preamplifiers; Signal design; Signal to noise ratio; Silicon; Strips; Testing;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.57351
Filename
57351
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