DocumentCode
1476026
Title
High-resolution current measurement system using a high-Tc superconductor sampler
Author
Hidaka, Mutsuo ; Ando, Noriaki ; Satoh, Tetsuro ; Tahara, Shuichi
Author_Institution
NEC Corp., Tsukuba, Japan
Volume
11
Issue
1
fYear
2001
fDate
3/1/2001 12:00:00 AM
Firstpage
986
Lastpage
989
Abstract
We are developing a prototype system for measuring high-frequency current flowing through a room-temperature sample without contact. It is based on a high-Tc superconductor sampler that can measure current waveforms at picosecond and microampere resolution. The sampler chip is housed in a vacuum chamber and is cooled down to its operating temperature by a GM-pulse tube cryocooler. Current flowing through the sample, which is placed just below and outside the vacuum chamber, generates a magnetic field. The sampler can measure this current because a superconducting loop, which includes the comparator junction of the sampler, picks up the magnetic field. Sinusoidal current flowing through a 50-ohm microstrip line was successfully observed up to 7 GHz by the system. Frequency dependence of measurement sensitivity is a problem to overcome for applying it to practical uses
Keywords
electric current measurement; high-temperature superconductors; microstrip lines; microwave measurement; superconducting microwave devices; 50 ohm; 7 GHz; Gifford-McMahon pulse tube cryocooler; SFQ circuit; high-Tc superconductor sampler; high-frequency current measurement system; magnetic field; microstrip line; Current measurement; Electron tubes; Frequency dependence; Frequency measurement; Josephson junctions; Magnetic field measurement; Microstrip; Prototypes; Semiconductor device measurement; Temperature;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.919514
Filename
919514
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