• DocumentCode
    1476026
  • Title

    High-resolution current measurement system using a high-Tc superconductor sampler

  • Author

    Hidaka, Mutsuo ; Ando, Noriaki ; Satoh, Tetsuro ; Tahara, Shuichi

  • Author_Institution
    NEC Corp., Tsukuba, Japan
  • Volume
    11
  • Issue
    1
  • fYear
    2001
  • fDate
    3/1/2001 12:00:00 AM
  • Firstpage
    986
  • Lastpage
    989
  • Abstract
    We are developing a prototype system for measuring high-frequency current flowing through a room-temperature sample without contact. It is based on a high-Tc superconductor sampler that can measure current waveforms at picosecond and microampere resolution. The sampler chip is housed in a vacuum chamber and is cooled down to its operating temperature by a GM-pulse tube cryocooler. Current flowing through the sample, which is placed just below and outside the vacuum chamber, generates a magnetic field. The sampler can measure this current because a superconducting loop, which includes the comparator junction of the sampler, picks up the magnetic field. Sinusoidal current flowing through a 50-ohm microstrip line was successfully observed up to 7 GHz by the system. Frequency dependence of measurement sensitivity is a problem to overcome for applying it to practical uses
  • Keywords
    electric current measurement; high-temperature superconductors; microstrip lines; microwave measurement; superconducting microwave devices; 50 ohm; 7 GHz; Gifford-McMahon pulse tube cryocooler; SFQ circuit; high-Tc superconductor sampler; high-frequency current measurement system; magnetic field; microstrip line; Current measurement; Electron tubes; Frequency dependence; Frequency measurement; Josephson junctions; Magnetic field measurement; Microstrip; Prototypes; Semiconductor device measurement; Temperature;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.919514
  • Filename
    919514