Analysis of electromagnetic coupling effects in integrated Josephson junction logic devices by the FDTD technique

Author

Dimov, Boyko ; Toepfer, Hannes ; Uhlmann, Hermann F.

Author_Institution

Dept. of Fundamentals & Theor. of Electr. Eng., Univerisity of Technol. Ilmenau, Germany

Volume

11

Issue

1

fYear

2001

fDate

3/1/2001 12:00:00 AM

Firstpage

1102

Lastpage

1105

Abstract

A very important step of the design of circuits and devices in the Josephson junction technology is the complete and correct calculation of their electrical characteristics. Due to the very high clock speed of up to 100 GHz, dynamic effects like the electromagnetic coupling start to play a significant role over the operation of the system. The presented work reports on the implementation of the FDTD technique for the description of the electromagnetic coupling effects in the Josephson devices. Some typical microstrip layouts are considered strictly taking in account the technological specifications. The obtained results are analyzed in respect to the constraints, which the coupling effects impose on the lateral dimensions of the microstrip lines

Keywords

electromagnetic coupling; finite difference time-domain analysis; microstrip lines; superconducting logic circuits; 100 GHz; FDTD technique; Josephson junction logic device; electrical characteristics; electromagnetic coupling; microstrip line; superconducting integrated circuit; Clocks; Electric variables; Electromagnetic analysis; Electromagnetic coupling; Finite difference methods; Integrated circuit technology; Josephson junctions; Microstrip; Superconducting devices; Time domain analysis;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.919540

Filename

919540