Title :
Ferroelectric characterisation using Josephson junctions
Author :
McBrien, Philip F. ; Booij, Wilfred E. ; Burnell, Gavin ; Kahlmann, Frank ; Blamire, Mark G. ; Romans, Edward J. ; Pegrum, Colin M. ; Tarte, Edward J.
Author_Institution :
Dept. of Mater. Sci. & Metall., Cambridge Univ., UK
fDate :
3/1/2001 12:00:00 AM
Abstract :
Measurements of the permittivity of a series of strontium titanate films of various thicknesses at frequencies from 100 to 900 GHz are reported. The permittivity was measured using Josephson junctions coupled to external resonators. The permittivity was found to decrease with decreasing film thickness and was frequency independent. On application of a dielectric bias voltage, the permittivity of a 200 nm film was tunable between 245 and 112 at 30 K
Keywords :
Josephson effect; ferroelectric thin films; microwave measurement; permittivity measurement; strontium compounds; superconducting resonators; 100 to 900 GHz; 30 K; Josephson junction; SrTiO3; ferroelectric characteristics; permittivity measurement; resonator; strontium titanate film; Dielectric measurements; Ferroelectric films; Ferroelectric materials; Frequency measurement; Josephson junctions; Permittivity measurement; Strontium; Thickness measurement; Titanium compounds; Voltage;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
