Ferroelectric characterisation using Josephson junctions

Author

McBrien, Philip F. ; Booij, Wilfred E. ; Burnell, Gavin ; Kahlmann, Frank ; Blamire, Mark G. ; Romans, Edward J. ; Pegrum, Colin M. ; Tarte, Edward J.

Author_Institution

Dept. of Mater. Sci. & Metall., Cambridge Univ., UK

Volume

11

Issue

1

fYear

2001

fDate

3/1/2001 12:00:00 AM

Firstpage

1158

Lastpage

1161

Abstract

Measurements of the permittivity of a series of strontium titanate films of various thicknesses at frequencies from 100 to 900 GHz are reported. The permittivity was measured using Josephson junctions coupled to external resonators. The permittivity was found to decrease with decreasing film thickness and was frequency independent. On application of a dielectric bias voltage, the permittivity of a 200 nm film was tunable between 245 and 112 at 30 K

Keywords

Josephson effect; ferroelectric thin films; microwave measurement; permittivity measurement; strontium compounds; superconducting resonators; 100 to 900 GHz; 30 K; Josephson junction; SrTiO₃; ferroelectric characteristics; permittivity measurement; resonator; strontium titanate film; Dielectric measurements; Ferroelectric films; Ferroelectric materials; Frequency measurement; Josephson junctions; Permittivity measurement; Strontium; Thickness measurement; Titanium compounds; Voltage;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.919554

Filename

919554