Title :
Parasitic resistance in non-Foster circuits caused by current conveyor frequency response
Author :
Covington, John M. C. ; Kshatri, Varun S. ; Weldon, Thomas P. ; Adams, Ryan S.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of North Carolina at Charlotte, Charlotte, NC, USA
Abstract :
Current conveyors are useful for creating non-Foster circuit components such as negative capacitors. As with operational amplifiers, it is sometimes desirable to use phase compensation techniques to improve the phase margin and stability in these circuits. However, it is shown for negative capacitor applications that the frequency response in a current conveyor leads to undesired parasitic resistance and reduced quality factor, Q. Analysis of the circuit shows that current conveyor frequency response can cause such degraded performance. In addition, measured data for a CMOS implementation confirm the predicted deleterious effects of current conveyor frequency response on parasitic resistance and quality factor.
Keywords :
CMOS integrated circuits; Q-factor; circuit stability; current conveyors; frequency response; operational amplifiers; CMOS implementation; circuit stability; current conveyor; frequency response; nonFoster circuits; operational amplifiers; parasitic resistance; phase compensation; phase margin; quality factor; Capacitors; Current measurement; Electrical resistance measurement; Frequency measurement; Frequency response; Impedance; Resistance; current mode circuits; frequency response;
Conference_Titel :
SOUTHEASTCON 2014, IEEE
Conference_Location :
Lexington, KY
DOI :
10.1109/SECON.2014.6950739