DocumentCode
1476367
Title
Superfine resonant structure on IV-curves of long Josephson junction and its influence on flux flow oscillator linewidth
Author
Koshelets, Valery P. ; Ermakov, Andrey B. ; Shitov, Sergey V. ; Dmitriev, Pavel N. ; Filippenko, Lyudmila V. ; Baryshev, Andrey M. ; Luinge, Willem ; Mygind, Jesper ; Vaks, Vladimir L. ; Pavel´ev, D.G.
Author_Institution
Inst. of Radio Eng. & Electron., Acad. of Sci., Moscow, Russia
Volume
11
Issue
1
fYear
2001
fDate
3/1/2001 12:00:00 AM
Firstpage
1211
Lastpage
1214
Abstract
The Josephson Flux Flow Oscillator (FFO) has proven to be a perfect on-chip local oscillator for integrated submm receivers; a noise temperature (DSB) below 100 K has been achieved at 500 GHz. Recently a FFO linewidth as low as 1 Hz has been measured in the frequency range 270 - 440 GHz. A new technique for both linewidth measurements and phase locking of the FFO is developed; this method employs an offchip harmonic multiplier. By measuring the frequency of the FFO radiation emission, its IV-curve (IVC) can be reconstructed with an accuracy better than 1 nV. A superfine resonant structure with a voltage spacing of about 20 nV and extremely low differential resistance has been observed in the FFO IVCs. This resonant structure modifies the performance of the FFO compared to the one expected from the “averaged IVC”. The influence of this resonant structure on phase locking is discussed. Also results of FFO phase noise measurements are presented
Keywords
flux flow; phase locked oscillators; phase noise; submillimetre wave integrated circuits; submillimetre wave oscillators; submillimetre wave receivers; superconducting device noise; superconducting integrated circuits; superconducting microwave devices; 270 to 440 GHz; 500 GHz; FFO phase noise measurements; IV-curve; Josephson flux flow oscillator; extremely low differential resistance; flux flow oscillator linewidth; integrated submm receivers; linewidth measurements; long Josephson junction; noise temperature; offchip harmonic multiplier; on-chip local oscillator; phase locking; superfine resonant structure; voltage spacing; Antenna measurements; Frequency; Josephson junctions; Local oscillators; Noise measurement; Phase measurement; Resonance; Semiconductor device measurement; Superconducting device noise; Telephony;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.919567
Filename
919567
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