DocumentCode
1476630
Title
Noise properties of YBa2Cu3O7-x step-edge junction dc SQUID magnetometers prepared on sapphire substrates
Author
Lim, Hae-Ryong ; Kim, In-Seon ; Park, Yong Ki ; Kim, Dong Ho
Author_Institution
Korea Res. Inst. of Standard Sci., Taejon, South Korea
Volume
11
Issue
1
fYear
2001
fDate
3/1/2001 12:00:00 AM
Firstpage
1355
Lastpage
1358
Abstract
Step-edge YBa2Cu3O7-x (YBCO) dc SQUID magnetometers on sapphire substrates have been fabricated. CeO2 buffer layers and YBCO films were deposited in situ on the low angle (~35°) steps formed on the sapphire substrates with various thickness ratio of YBCO thin film to step height. Noise properties of the magnetometer exhibit quite different behavior according to the thickness ratio. The field noise of the dc SQUID magnetometer was measured to be 100~300 fT/√Hz at 100 Hz and about 1.5 pT/√Hz at 1 Hz with a dc bias method, and 450 fT/√Hz at 1 Hz with an ac bias method
Keywords
SQUID magnetometers; barium compounds; high-temperature superconductors; pulsed laser deposition; superconducting device noise; superconducting thin films; yttrium compounds; 1 Hz; 100 Hz; Al2O3; CeO2; CeO2 buffer layers; YBa2Cu3O7-x step-edge junction dc SQUID magnetometers; YBa2Cu3O7; ac bias method; dc bias method; field noise; film thickness ratio; in situ deposition; low angle steps; noise properties; pulsed laser deposition; sapphire substrates; step height; Buffer layers; Fabrication; Gold; Josephson junctions; Magnetic properties; Milling; SQUID magnetometers; Substrates; Transistors; Yttrium barium copper oxide;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.919602
Filename
919602
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