DocumentCode :
1476746
Title :
Creating small fault dictionaries [logic circuit fault diagnosis]
Author :
Chess, Brian ; Larrabee, Tracy
Author_Institution :
Hewlett-Packard Co., Palo Alto, CA, USA
Volume :
18
Issue :
3
fYear :
1999
fDate :
3/1/1999 12:00:00 AM
Firstpage :
346
Lastpage :
356
Abstract :
Diagnostic fault simulation can generate enormous amounts of data. The techniques used to manage this data can have significant effect on the outcome of the fault diagnosis procedure. We first demonstrate that if information is removed from a fault dictionary, its ability to diagnose unmodeled faults may be severely curtailed even if dictionary quality metrics remain unaffected; we, therefore, focus on methods for producing small, lossless dictionaries, We present a new dictionary organization based on error sets, which is amenable to standard data-compression techniques. We compare several dictionary organizations and the effect of standard data-compression techniques on each of them. An appropriate organization and encoding makes dictionary-based diagnosis practical for very large circuits
Keywords :
circuit analysis computing; data compression; fault diagnosis; fault simulation; integrated circuit testing; integrated logic circuits; logic testing; data-compression techniques; diagnostic fault simulation; dictionary organization; dictionary-based diagnosis; encoding; error sets; fault diagnosis; fault dictionaries; small lossless dictionaries; very large circuits; CMOS technology; Circuit faults; Circuit testing; Dictionaries; Failure analysis; Fault diagnosis; Manufacturing processes; Production; Standards organizations; Wire;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.748164
Filename :
748164
Link To Document :
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