1476826

Introduction to the Special Issue on the 1998 Custom Integrated Circuits Conference

34

3

1999

3/1/1999 12:00:00 AM

266

267

Analog integrated circuits; Application specific integrated circuits; Built-in self-test; Circuit testing; Digital integrated circuits; Integrated circuit modeling; Microwave devices; Radio frequency; Radiofrequency integrated circuits; Special issues and sections;

English

Solid-State Circuits, IEEE Journal of

ieee

0018-9200

jour

10.1109/JSSC.1999.748176

748176