The characterization of thermal cycling behavior of YBa2Cu3O7 on Y-stabilized ZrO2 buffered (100) Si

The thermal cyclic behavior of the YBa₂Cu₃O ₇ high-temperature superconductor (HTS) thin film on Y-stabilized ZrO₂ buffered (100) Si was systematically studied in this paper. These HTS assemblies underwent thermal cycling from 77 K to room temperature, and their thermal fatigue reliability was evaluated by the initiation and propagation of their thermal fatigue defects by using the SEM measurement, It was found that YBa₂Cu₃O7 superconductor thin films on the Y-stabilized ZrO₂ buffered (100) Si substrate eventually spalled after a number of cycles under temperature fluctuation. It is noticed that the processing parameter and procedures of the superconductor assemblies plays an important role on the cyclic life of the assembly. It is noticed that the defects in the buffer layer, inhomogeneity of the film composition and cluster size, and variation in film thickness not only enhance the defect initiation, but also have a significant influence on the superconductivity of the superconductor assemblies. The results of this study provide some practical information with regard to the performance enhancement and quality control of these thin-film superconductor devices,