Growth and characterization of Eu-Cu-O thin films on YSZ(100) substrates

Author

Gao, J. ; Tang, W.H. ; Yau, C.Y.

Author_Institution

Dept. of Phys., Hong Kong Univ., China

Volume

11

Issue

1

fYear

2001

fDate

3/1/2001 12:00:00 AM

Firstpage

2746

Lastpage

2748

Abstract

High quality epitaxial Eu₂CuO₄ (ECO) thin films have been deposited on yttrium-stabilized zirconia (YSZ) (100) substrates by magnetron rf sputtering method. The obtained ECO films are highly c-axis-oriented and well crystallized, as shown by x-ray diffraction, rocking curves. The influence of oxygen out-diffusion on the c-axis length and the resistance behavior were studied. The post vacuum annealing removes the excess oxygen from the structure of ECO. As a result, the c-axis length decreases and the resistivity increases. By using ECO as a buffer layer, extremely smooth surface of YBCO was obtained on YSZ substrates

Keywords

X-ray diffraction; europium compounds; high-temperature superconductors; insulating thin films; sputtered coatings; Eu₂CuO₄; Y₂O₃ZrO₂; YBa₂Cu₃O₇; YSZ(100) substrates; c-axis length; highly c-axis-oriented; magnetron rf sputtering; oxygen out-diffusion; post vacuum annealing; resistance behavior; rocking curves; x-ray diffraction; Annealing; Buffer layers; Conductivity; Crystallization; Sputtering; Substrates; Surface resistance; Transistors; X-ray diffraction; Yttrium;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.919631

Filename

919631