DocumentCode :
1476862
Title :
Automated hierarchical CMOS analog circuit stack generation with intramodule connectivity and matching considerations
Author :
Naiknaware, Ravindranath ; Fiez, Terri S.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Washington State Univ., Pullman, WA, USA
Volume :
34
Issue :
3
fYear :
1999
fDate :
3/1/1999 12:00:00 AM
Firstpage :
304
Lastpage :
317
Abstract :
An efficient automated layout for CMOS transistors in analog circuits is described. The matching requirements are used as the primary constraint on the analog layout; however, parasitic capacitances and area considerations are also included. A designer-chosen arbitrary circuit partition from the schematic can be used to generate the corresponding layout as an optimum stack of transistors with complete intramodule connectivity. The transistor stack generation is performed by representing the circuit with a diffusion graph and recursively fragmenting the graph until the base constructs are reached. For each of the modules, the port structures are also created. These port structures are considered as part of the module area and parasitic optimization procedure. With aspect-ratio-related constraints, the procedure allows optimal floorplanning. The results are demonstrated through several examples
Keywords :
CMOS analogue integrated circuits; capacitance; circuit layout CAD; circuit optimisation; graph theory; integrated circuit layout; CMOS analog circuit stack generation; CMOS transistors; analog layout; automated hierarchical CMOS layout generation; automated layout; diffusion graph; intramodule connectivity; matching considerations; module area optimization; optimal floorplanning; parasitic capacitances; parasitic optimization procedure; port structures; transistor stack generation; Analog circuits; CMOS analog integrated circuits; CMOS process; Capacitors; Design automation; Design methodology; Integrated circuit layout; Integrated circuit yield; Mirrors; Parasitic capacitance;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.748182
Filename :
748182
Link To Document :
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