• DocumentCode
    1476891
  • Title

    CMOS technology-year 2010 and beyond

  • Author

    Iwai, Hiroshi

  • Author_Institution
    Toshiba Corp., Kawasaki, Japan
  • Volume
    34
  • Issue
    3
  • fYear
    1999
  • fDate
    3/1/1999 12:00:00 AM
  • Firstpage
    357
  • Lastpage
    366
  • Abstract
    MOS large-scale-integration circuits (LSIs), having advanced remarkably during the past 25 years, are expected to continue to progress well into the next century. The progress has been driven by the downsizing of the components in an LSI, such as MOSFETs. However, even before the downsizing of MOSFETs reaches its fundamental limit, the downsizing is expected to encounter severe technological and economic problems at the beginning of next century when the minimum feature size of LSIs is going to shift to 0.1 and sub-0.1 μm. In this paper, the anticipated difficulties and some concepts for 0.1- and sub-0.1 μm LSIs are explained based on the research of the downsizing MOSFET into such a dimension, and a further concept for deep sub-0.1-μm LSIs is described
  • Keywords
    CMOS integrated circuits; MOSFET; integrated circuit technology; large scale integration; technological forecasting; 0.1 micron; CMOS technology; CMOSFETs; MOSFET downsizing; deep submicron LSI; large-scale-integration; CMOS integrated circuits; CMOS technology; Calculators; Costs; Economics; Integrated circuit technology; Large scale integration; MOSFET circuits; Microprocessors; Random access memory;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.748187
  • Filename
    748187