DocumentCode :
1476954
Title :
Intermodulation distortion and Josephson vortices in YBCO bicrystal grain boundaries
Author :
Oates, Daniel E. ; Xin, Hao ; Dresselhaus, Gene ; Dresselhaus, Mildred S.
Author_Institution :
Lincoln Lab., MIT, Lexington, MA, USA
Volume :
11
Issue :
1
fYear :
2001
fDate :
3/1/2001 12:00:00 AM
Firstpage :
2804
Lastpage :
2807
Abstract :
The properties of grain boundaries at microwave-frequencies in the high-Tc materials are of interest for both practical applications and basic physics. We report the measurements of intermodulation distortion (IMD) in engineered grain boundaries in YBCO films fabricated on sapphire bicrystals with misorientation angles of 0, 2, 5, 7.5, 10 and 24°. The measurements indicate that low-angle grain boundaries are not the source of IMD in epitaxial films. We also report the microwave response of YBCO 24° bicrystal grain boundaries to small dc magnetic fields, from 0 to 10 Oe. Peaks in the microwave loss as high as 5 times the baseline values at certain dc magnetic fields are observed. The losses result from individual Josephson vortices penetrating into the grain-boundary which is modeled as a long Josephson junction. Excellent quantitative agreement between the experimental data and the model has been obtained for the case of the increasing field
Keywords :
Josephson effect; barium compounds; bicrystals; grain boundaries; high-temperature superconductors; intermodulation distortion; losses; mixed state; superconducting epitaxial layers; yttrium compounds; Al2O3; HTSC; Josephson vortices; YBaCuO; YBaCuO bicrystal grain boundaries; epitaxial films; intermodulation distortion; long Josephson junction; low-angle grain boundaries; microwave loss; microwave response; microwave-frequencies; misorientation angles; sapphire bicrystals; small DC magnetic fields; Distortion measurement; Electrical resistance measurement; Grain boundaries; Intermodulation distortion; Magnetic field measurement; Microwave measurements; Physics; Surface impedance; Transistors; Yttrium barium copper oxide;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.919646
Filename :
919646
Link To Document :
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