• DocumentCode
    14770
  • Title

    CMOS SPADs: Design Issues and Research Challenges for Detectors, Circuits, and Arrays

  • Author

    Palubiak, Darek P. ; Deen, M.J.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, ON, Canada
  • Volume
    20
  • Issue
    6
  • fYear
    2014
  • fDate
    Nov.-Dec. 2014
  • Firstpage
    409
  • Lastpage
    426
  • Abstract
    Solid-state single photon detectors are playing a significant role in the development of high-performance single-photon imaging systems for fluorescence lifetime imaging, time-of-flight positron emission tomography and Raman Spectroscopy applications. The main driving factors are the unparalleled levels of miniaturization and portability, low fabrication costs, and high overall performance resulting from the integration of single-photon avalanche diodes (SPADs) with mixed-signal circuits in deep-submicron (DSM) complementary metal-oxide-semiconductor (CMOS) technology. At the heart of such imaging systems is the SPAD, capable of single-photon sensitivity and sub-nanosecond time resolution, and its associated circuitry, which in DSM CMOS, is capable of high-speed, low-power mixed-mode signal processing. In this paper, we review and discuss the most recent developments in DSM CMOS SPAD detectors, circuits and arrays and investigate issues of scalability, miniaturization and performance trade-offs involved in designing SPAD imaging systems. Design considerations, research challenges, and future directions for CMOS SPAD image sensors will be highlighted and addressed.
  • Keywords
    CMOS image sensors; avalanche diodes; CMOS; arrays; circuits; deep-submicron complementary metal-oxide-semiconductor technology; detectors; image sensors; single-photon avalanche diodes; CMOS integrated circuits; CMOS technology; Detectors; Imaging; Photonics; Standards; Tunneling; Raman; Single-photon avalanche diode (SPAD); TDC; fluorescence lifetime imaging (FLIM); imagers; positron emission tomography (PET);
  • fLanguage
    English
  • Journal_Title
    Selected Topics in Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    1077-260X
  • Type

    jour

  • DOI
    10.1109/JSTQE.2014.2344034
  • Filename
    6872559