Title :
Critical current degradation in jointed area of Ag-sheathed BSCCO tapes
Author :
Nah, Wansoo ; Hwangbo, Hoon ; Kim, Byung-Sung ; Lee, Joon Ho ; Kim, Jung Ho ; Joo, Jinho ; Ha, Hong-Soo ; Sohn, Myung-Hwan
Author_Institution :
Sch. of Electr. & Comput. Eng., Sungkyunkwan Univ., Suwon, South Korea
fDate :
3/1/2001 12:00:00 AM
Abstract :
Usually, the critical current of jointed BSCCO-2223 tapes degrades quite a lot compared to the normal tape regions. Besides the material characteristics such as thermal and mechanical properties, it has been thought that the current redistribution around the jointed region is one of the main causes of the critical current degradation. Analyzing the experimentally obtained voltage-current characteristics around the jointed tape region, we found linear voltage components around the jointed area, especially in the transition region, which suggests that the current redistribution around the transition area is one of the main causes of critical current degradation. In this paper, we present the experimental results and analysis procedure for both mono- and multi-filamentary tapes, and describe the current redistribution effects on the critical current degradation, especially for a mono-filamentary tape case
Keywords :
bismuth compounds; calcium compounds; critical current density (superconductivity); high-temperature superconductors; lead compounds; multifilamentary superconductors; silver; strontium compounds; superconducting tapes; (BiPb)2Sr2Ca2Cu3O 10-Ag; Ag-sheathed BSCCO tapes; critical current degradation; current redistribution; jointed BSCCO-2223 tapes; jointed area; linear voltage components; mono-filamentary tapes; multi-filamentary tapes; voltage-current characteristics; Bismuth compounds; Critical current; Etching; Pressing; Shape; Silver; Superconductivity; Switches; Thermal degradation; Voltage;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
