Critical current degradation in jointed area of Ag-sheathed BSCCO tapes

Author

Nah, Wansoo ; Hwangbo, Hoon ; Kim, Byung-Sung ; Lee, Joon Ho ; Kim, Jung Ho ; Joo, Jinho ; Ha, Hong-Soo ; Sohn, Myung-Hwan

Author_Institution

Sch. of Electr. & Comput. Eng., Sungkyunkwan Univ., Suwon, South Korea

Volume

11

Issue

1

fYear

2001

fDate

3/1/2001 12:00:00 AM

Firstpage

3014

Lastpage

3017

Abstract

Usually, the critical current of jointed BSCCO-2223 tapes degrades quite a lot compared to the normal tape regions. Besides the material characteristics such as thermal and mechanical properties, it has been thought that the current redistribution around the jointed region is one of the main causes of the critical current degradation. Analyzing the experimentally obtained voltage-current characteristics around the jointed tape region, we found linear voltage components around the jointed area, especially in the transition region, which suggests that the current redistribution around the transition area is one of the main causes of critical current degradation. In this paper, we present the experimental results and analysis procedure for both mono- and multi-filamentary tapes, and describe the current redistribution effects on the critical current degradation, especially for a mono-filamentary tape case

Keywords

bismuth compounds; calcium compounds; critical current density (superconductivity); high-temperature superconductors; lead compounds; multifilamentary superconductors; silver; strontium compounds; superconducting tapes; (BiPb)₂Sr₂Ca₂Cu₃O ₁₀-Ag; Ag-sheathed BSCCO tapes; critical current degradation; current redistribution; jointed BSCCO-2223 tapes; jointed area; linear voltage components; mono-filamentary tapes; multi-filamentary tapes; voltage-current characteristics; Bismuth compounds; Critical current; Etching; Pressing; Shape; Silver; Superconductivity; Switches; Thermal degradation; Voltage;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.919697

Filename

919697