Title :
System verification using multilevel concurrent simulation
Author :
Lentz, Karen Panetta ; Heller, Jamie ; Montessoro, Pier Luca
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Tufts Univ., Medford, MA, USA
Abstract :
The verification of multilevel designs in a single simulator environment can be achieved efficiently using concurrent simulation. MCS is a research simulation tool developed in conjunction with Compaq Computer Corporation and Draper Laboratories. MCS overcomes limitations imposed by merged simulator approaches. MCS achieves this by incorporating techniques that are not specific to any abstraction level, making it attractive for testing interface interconnects and mixed-mode logic. We describe our approach, which is a cohesive simulator platform based on concurrent simulation algorithms
Keywords :
circuit simulation; formal verification; parallel programming; virtual machines; MCS; abstraction level; cohesive simulator platform; concurrent simulation; concurrent simulation algorithms; interface interconnect testing; merged simulator approaches; mixed-mode logic; multilevel concurrent simulation; multilevel designs; research simulation tool; single simulator environment; system verification; Analytical models; Circuit faults; Circuit simulation; Computational modeling; Design engineering; Intellectual property; Kernel; Logic testing; Process design; Robustness;
Journal_Title :
Micro, IEEE
