• DocumentCode
    1477604
  • Title

    DRAM Architecture and Testing

  • Author

    Cockburn, Bruce F. ; Lombardi, Fabrizio ; Meyer, Fred J.

  • Author_Institution
    University of Alberta
  • Volume
    16
  • Issue
    1
  • fYear
    1999
  • Firstpage
    19
  • Lastpage
    21
  • Keywords
    Built-in self-test; Circuit testing; Dielectric materials; Driver circuits; Integrated circuit interconnections; Logic; Random access memory; SDRAM; Threshold voltage; Wiring;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.1999.748801
  • Filename
    748801
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1477604