Title :
DRAM Architecture and Testing
Author :
Cockburn, Bruce F. ; Lombardi, Fabrizio ; Meyer, Fred J.
Author_Institution :
University of Alberta
Keywords :
Built-in self-test; Circuit testing; Dielectric materials; Driver circuits; Integrated circuit interconnections; Logic; Random access memory; SDRAM; Threshold voltage; Wiring;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.1999.748801
