Title :
Superconducting properties of YNdBaCuO and NdBaCuO thin films deposited by dc sputtering
Author :
Salluzzo, M. ; Andreone, A. ; Cassinese, A. ; Capua, R. Di ; Iavarone, M. ; Maglione, M.G. ; Pica, G. ; Vaglio, R.
Author_Institution :
Dept. of Phys., Univ. Federico II, Naples, Italy
fDate :
3/1/2001 12:00:00 AM
Abstract :
We report on fabrication of Y1NdxBa2-x Cu3O7-δ and Nd1+xBa2-x Cu3O7-δ thin films deposited by high oxygen pressure dc sputtering. The structural properties are investigated by X-ray diffraction while Scanning Tunneling Microscopy (STM) has been used to determine the surface morphology. The critical temperature and the critical current density are obtained by transport and inductive measurements. The microwave properties have been studied at 19.8 GHz by a dielectric resonator technique. For both compounds highly epitaxial c-axis thin films are routinely obtained on SrTiO3 and LaAlO3 substrates. Depending on the deposition conditions, films characterized by surface resistance comparable of even better than YBa2Cu3O7-δ have been obtained, with a substantial improvement of the structural properties and of the surface morphology. The role played by the Nd/Ba substitution on the growth and on the superconducting properties is discussed
Keywords :
X-ray diffraction; barium compounds; critical current density (superconductivity); high-temperature superconductors; neodymium compounds; scanning tunnelling microscopy; sputtered coatings; superconducting thin films; surface topography; yttrium compounds; 19.8 GHz; LaAlO3 substrates; NdBaCuO; STM; SrTiO3 substrates; X-ray diffraction; YNdBaCuO; critical current density; critical temperature; dc sputtering; dielectric resonator technique; high temperature superconductors; highly epitaxial c-axis thin films; microwave properties; structural properties; superconducting properties; surface morphology; Dielectric substrates; Dielectric thin films; Fabrication; Neodymium; Sputtering; Superconducting epitaxial layers; Superconducting microwave devices; Superconducting thin films; Surface morphology; Surface resistance;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
