• DocumentCode
    1478014
  • Title

    A new metastable phase with Tc of 32 K in La2CuO4+δ system

  • Author

    Chen, Ling ; Dong, Cheng ; Che, Guangcan ; Zhou, Fang ; Huang, Yuzhen ; Zhao, Zhongxian

  • Author_Institution
    Inst. of Phys., Acad. Sinica, Beijing, China
  • Volume
    11
  • Issue
    1
  • fYear
    2001
  • fDate
    3/1/2001 12:00:00 AM
  • Firstpage
    3403
  • Lastpage
    3406
  • Abstract
    A metastable superconducting phase with Tc of 32 K and δ=0.084 in La2CuO4+δ system is reported in this paper. It is prepared by electrochemical oxidation for more than 2 months using a small constant current of 10 μA. Its structure and physical properties are studied by X-ray diffraction, magnetic susceptibility and resistance measurements. This phase (we call it β-phase) is different from the previously known one (we call it α-phase) that has the same Tc but 0⩽δ⩽0.055. After heat treatment at temperature T=80°C, the β-phase decomposes into two phases with Tc´s of ~17 K and ~30 K, respectively. This kind of behavior is similar to the phase with Tc of 45 K. Our study shows that Tc increases with the intercalation rate, and oxygen distribution is an important factor for controlling superconducting properties
  • Keywords
    X-ray diffraction; critical current density (superconductivity); high-temperature superconductors; lanthanum compounds; magnetic susceptibility; phase diagrams; superconducting transition temperature; 10 muA; 2 month; 32 K; La2CuO4+δ system; La2CuO4; X-ray diffraction; electrochemical oxidation; high temperature superconductor; intercalation rate; magnetic susceptibility; metastable phase; metastable superconducting phase; oxygen distribution; resistance measurements; small constant current; Electrical resistance measurement; High temperature superconductors; Laboratories; Magnetic field measurement; Magnetic properties; Magnetic susceptibility; Metastasis; Oxidation; Superconductivity; Telephony;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.919793
  • Filename
    919793