DocumentCode :
1478018
Title :
Nanostructure fabrication using electron beam and its application to nanometer devices
Author :
Matsui, Shinji
Author_Institution :
Fundamental Res. Labs., NEC Corp., Tsukuba, Japan
Volume :
85
Issue :
4
fYear :
1997
fDate :
4/1/1997 12:00:00 AM
Firstpage :
629
Lastpage :
643
Abstract :
Nanofabrication developed by using electron beam (EB) are described. Ten-nm structures of organic positive and negative resist patterns have been achieved by using a commercially available EB lithography system with energy of 30-50 keV. The self-developing properties of an AlF3-doped LiF inorganic resist have been studied for sub-10-nm lithography. By optimizing the inorganic resist film quality, 5-nm linewidth patterns with 60-nm periodicity were directly delineated under a 30-keV EB. Moreover, EB-induced deposition is described as an interesting method for nanofabrication. An novel approach for nanolithography using de Broglie wave has been developed. Line and dot patterns with 100-nm periodicity were exposed on a PMMA resist by EB holography with a thermal field-emitter gun and an electron biprism. This technique allows us to produce nanoscale periodic patterns simultaneously. Furthermore, the possibility of nanostructure fabrication by atomic-beam holography has been demonstrated by using a laser-trap technique and a computer-generated hologram made by EB lithography. As applications of EB nanolithography to nanodevices, a 40-nm-gate NMOS Si device and a high-temperature-operation single-electron transistor (SET) are described
Keywords :
MOSFET; electron beam deposition; electron beam lithography; holography; nanotechnology; quantum interference devices; single electron transistors; 30 to 50 keV; AlF3-doped LiF inorganic resist; EB deposition; EB holography; EB lithography; LiF:AlF3; NMOS device; PMMA resist; Si; atomic beam holography; computer-generated hologram; de Broglie wave; electron beam; electron biprism; laser trap; nanolithography; nanometer device; nanostructure fabrication; organic negative resist; organic positive resist; self-development; single-electron transistor; thermal field-emitter gun; Atomic beams; Electron beams; Holography; Lithography; Nanofabrication; Nanolithography; Optical device fabrication; Optimization methods; Resists; Thermal resistance;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/5.573752
Filename :
573752
Link To Document :
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