Title :
DC track edge interactions at close spacing
Author :
Glavinas, Elias ; Indeck, Ronald S. ; Muller, Marcel W. ; Tong, Hua Ching
Author_Institution :
Magnetics & Inf. Sci. Center, Washington Univ., St. Louis, MO, USA
fDate :
9/1/1997 12:00:00 AM
Abstract :
We investigate dc track edge interactions by placing edges at close spacings and observing the output through head readback and magnetic force microscopy. We find a correlation between the onset of edge interaction and the recording medium coercivity. Readback experiments display a region of edge interaction that results in linear noise power variation; microscopy imaging supports this conclusion
Keywords :
magnetic force microscopy; magnetic recording noise; DC track edge interaction; head readback; magnetic force microscopy; noise power; recording medium coercivity; Coercive force; Degradation; Displays; Information science; Magnetic force microscopy; Magnetic forces; Magnetic heads; Magnetic noise; Magnetic recording; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on
