DocumentCode :
1478210
Title :
Linearizing the read process for write nonlinearity measurements
Author :
Wilson, Bruce A. ; Wang, Shan X. ; Taratorin, Alex M.
Author_Institution :
Dept. of Electr. Eng., Stanford Univ., CA, USA
Volume :
33
Issue :
5
fYear :
1997
fDate :
9/1/1997 12:00:00 AM
Firstpage :
2692
Lastpage :
2694
Abstract :
Many standard tests for write nonlinearities such as nonlinear transition shift and partial erasure assume a linear read process. Nonlinear effects from readback with a magnetoresistive head can make the results of these tests difficult to interpret. We show how a polynomial can be used to approximate the inverse transfer function and thus linearize the read channel. Write nonlinearities can be measured more easily by performing tests on the linearized channel. We also show how linearizing the channel for PRML detection is limited by amplification of noise over parts of the inverse transfer curve with high differential gain
Keywords :
linearisation techniques; magnetic heads; magnetoresistive devices; polynomials; transfer functions; PRML detection; channel linearization; differential gain; inverse transfer function; magnetoresistive read head; noise amplification; nonlinear transition shift; partial erasure; polynomial; readback; write nonlinearity measurement; Analog-digital conversion; Autocorrelation; Density measurement; Energy measurement; Frequency estimation; Loss measurement; Magnetic heads; Magnetoresistance; Pattern analysis; Performance evaluation; Polynomials; Testing; Transfer functions; Velocity measurement;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.617447
Filename :
617447
Link To Document :
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