Title :
Relation between texture and critical current density of textured YBa2Cu3Ox plates
Author :
Larsen, B.H. ; Larsen, J.G. ; Abrahamsen, A.B. ; Poulsen, H.F. ; Tschentscher, T. ; Christiansen, J.K.S. ; Andersen, N.H.
Author_Institution :
Riso Nat. Lab., Roskilde, Denmark
fDate :
3/1/2001 12:00:00 AM
Abstract :
Textured YBa2Cu3Ox plates show a significant spread in the critical current density up to 12.000 A/cm2 measured by direct transport current at 77 K. This spread is related to the crystalline texture of the material. Optical polarization microscopy is used for initial examination of crystal alignment and texture. We use synchrotron radiation at 100 keV to perform x-ray diffraction measurements to obtain quantitative information about the texture. The crystallographic (110)-direction is found to be preferentially along the slab and the c-axis is parallel to the largest face. DC-magnetization is used to measure the magnetization critical current density of pieces cut around each x-ray measurement point. The results from x-ray diffraction, optical microscopy and magnetization critical current density are compared to the transport critical current density. The magnetization critical current is found to decrease exponentially with the in-plane texture
Keywords :
X-ray diffraction; barium compounds; critical current density (superconductivity); high-temperature superconductors; light polarisation; magnetisation; optical microscopy; texture; yttrium compounds; DC-magnetization; YBa2Cu3O; critical current density; crystal alignment; crystalline texture; crystallographic (110)-direction; direct transport current; in-plane texture; magnetization critical current density; optical microscopy; optical polarization microscopy; synchrotron radiation; texture; textured YBa2Cu3Ox plates; transport critical current density; x-ray diffraction; Critical current density; Crystalline materials; Crystallization; Current measurement; Density measurement; Magnetization; Optical diffraction; Optical materials; Optical microscopy; X-ray diffraction;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
