Title :
Microstructures of rapidly-heated/quenched and transformed Nb3 Al multifilamentary superconducting wires
Author :
Kikuchi, A. ; Iijima, Y. ; Inoue, K.
Author_Institution :
Nat. Res. Inst. for Metals, Ibaraki, Japan
fDate :
3/1/2001 12:00:00 AM
Abstract :
Microstructures of rapidly-heated/quenched and transformed Nb3Al multifilamentary wires were studied by using transmission electron microscopy. Nb/Al composite wires are fabricated by a jelly-roll process. The Nb/Al composite filaments changed into an Nb-Al supersaturated bcc solid solution with rapid-heating/quenching. The Nb-Al bcc phase consists of many crystal grains with diameters of 2-4 μm, surrounded with large-angle grain boundaries. Some spherical voids, about 0.1 micron in diameter, were also observed at the intra- and intergrains. All grain boundaries of the Nb-Al bcc phases are simple flat planes. Then, the Nb-Al bcc phases were transformed into A15 phases (grain size: 0.5-2.0 μm in diameter) with additional annealing. Secondary phases were not observed in the A15 filaments. Grain boundaries of the A15 phases show zig-zag shape unlike those of the Nb-Al bcc phases, and every grain of A15 phases is an aggregation of sub-grains of 80-150 nm in diameter. Sub-grain boundaries are small-angle ones. Moreover we found that many stacking faults formed in the A15 sub-grains in parallel with spaces of 10-20 nm. These numerous plane defects seem to be the main pinning centers in the rapidly-heated/quenched and transformed Nb3Al wires
Keywords :
aluminium alloys; annealing; flux pinning; grain boundaries; grain size; multifilamentary superconductors; niobium alloys; rapid solidification; stacking faults; transmission electron microscopy; type II superconductors; voids (solid); A15 phases; Nb3Al; annealing; composite wires; grain size; jelly-roll process; large-angle grain boundaries; multifilamentary superconducting wires; pinning centers; rapid-heating; rapid-quenching; spherical voids; stacking faults; supersaturated BCC solid solution; transmission electron microscopy; Annealing; Grain boundaries; Grain size; Microstructure; Niobium; Shape; Solids; Stacking; Transmission electron microscopy; Wires;
Journal_Title :
Applied Superconductivity, IEEE Transactions on