Evaluation methods for the examination of thick film materials

This paper describes analytical and evaluation techniques developed to provide a comprehensive picture of thick film materials. Examples are presented of the usefulness of the techniques in examining thick film materials and establishing the interactions which occur during processing. In particular, it is shown how the microstructure of the Du Pont 7800 and 1100 resistor systems have been identified, and how these structures are of use in understanding the electrical properties of fired resistors.