DocumentCode
1478638
Title
A method of measuring negative impedance
Author
Ellen, L.W. ; Oodan, A.P.
Volume
43
Issue
4
fYear
1973
fDate
4/1/1973 12:00:00 AM
Firstpage
253
Lastpage
256
Abstract
A method of measuring the components of a negative impedance has been developed. The device considered possesses an S-type negative impedance as opposed to an N-type, the tunnel diode being an example of the latter. The method of measurement is illustrated by measurements taken on a negative impedance booster used for compensating the losses of a wire transmission line. The technique of measurement is fairly simple and the accuracy of measurement depends upon the grade of standard components used for comparison andpossibly also on the magnitudes of the negative impedance components to be measured. For values of a series positive resistance of 60¿ and a parallel circuit composed of a negative resistance of 160¿ and negative capacitance of 0.013 f¿F, measurements were possible with uncertainties not exceeding ±2.15%, ±0.75% and ±1.85% respectively using 1.0% grade capacitors and 0.1% grade decade resistors.
Keywords
electrical impedance measurement; S-type negative impedance; accuracy of measurement; grade of standard components; negative impedance booster; negative impedance measurement;
fLanguage
English
Journal_Title
Radio and Electronic Engineer
Publisher
iet
ISSN
0033-7722
Type
jour
DOI
10.1049/ree.1973.0039
Filename
5268464
Link To Document