• DocumentCode
    1478638
  • Title

    A method of measuring negative impedance

  • Author

    Ellen, L.W. ; Oodan, A.P.

  • Volume
    43
  • Issue
    4
  • fYear
    1973
  • fDate
    4/1/1973 12:00:00 AM
  • Firstpage
    253
  • Lastpage
    256
  • Abstract
    A method of measuring the components of a negative impedance has been developed. The device considered possesses an S-type negative impedance as opposed to an N-type, the tunnel diode being an example of the latter. The method of measurement is illustrated by measurements taken on a negative impedance booster used for compensating the losses of a wire transmission line. The technique of measurement is fairly simple and the accuracy of measurement depends upon the grade of standard components used for comparison andpossibly also on the magnitudes of the negative impedance components to be measured. For values of a series positive resistance of 60¿ and a parallel circuit composed of a negative resistance of 160¿ and negative capacitance of 0.013 f¿F, measurements were possible with uncertainties not exceeding ±2.15%, ±0.75% and ±1.85% respectively using 1.0% grade capacitors and 0.1% grade decade resistors.
  • Keywords
    electrical impedance measurement; S-type negative impedance; accuracy of measurement; grade of standard components; negative impedance booster; negative impedance measurement;
  • fLanguage
    English
  • Journal_Title
    Radio and Electronic Engineer
  • Publisher
    iet
  • ISSN
    0033-7722
  • Type

    jour

  • DOI
    10.1049/ree.1973.0039
  • Filename
    5268464