• DocumentCode
    1478674
  • Title

    Properties of YBa2Cu3O7 thin films deposited on substrates and bicrystals with vicinal offcut and realization of high IcRn junctions

  • Author

    Poppe, U. ; Divin, Y.Y. ; Faley, M.I. ; Wu, J.S. ; Jia, C.L. ; Shadrin, P. ; Urban, K.

  • Author_Institution
    Inst. fur Festkorperforschung, Forschungszentrum Julich GmbH, Germany
  • Volume
    11
  • Issue
    1
  • fYear
    2001
  • fDate
    3/1/2001 12:00:00 AM
  • Firstpage
    3768
  • Lastpage
    3771
  • Abstract
    The surface morphology, microstructure and transport properties of epitaxial YBa2Cu3O7 and PrBa2Cu3O7 thin films and heterostructures deposited on slightly vicinal substrates of SrTiO3 by high pressure oxygen sputtering were studied. The vicinal angles of the substrates and bicrystals were less then 13°. Depending on the tilt angle of the substrate a transition from spiral or island to step-flow growth leading to an improvement of the surface roughness was observed. Atomic force and transmission electron microscopy were used for these investigations. Furthermore, electrical and structural properties of YBa2Cu3O7 thin films on vicinal offcut SrTiO3 bicrystals with different grain boundary types were studied. This included junctions with a 2×12° tilt or twist of the YBa2Cu3O7 c-axis across the grain boundary. In comparison to conventional [001]-tilt grain boundaries bicrystal Josephson junctions [100]-tilt grain boundaries showed high I cRn-products of up to 1.2 meV at 77 K and up to 8 meV at 4.2 K. IV-curve instabilities, probably of magnetic origin due to flux flow in the electrodes, often could be observed for junctions biased with high current densities
  • Keywords
    Josephson effect; atomic force microscopy; barium compounds; bicrystals; crystal microstructure; high-temperature superconductors; sputtered coatings; substrates; superconducting epitaxial layers; superconducting junction devices; surface structure; tilt boundaries; transmission electron microscopy; twist boundaries; yttrium compounds; 4.2 K; 77 K; HTSC; PrBa2Cu3O7; PrBa2Cu3O7 thin films; SrTiO3; YBa2Cu3O7; YBa2Cu3O7 thin films; atomic force microscopy; bicrystals; electrical properties; epitaxial films; flux flow; grain boundary types; heterostructures; high IcRn junctions; high current densities; high pressure oxygen sputtering; microstructure; step-flow growth; structural properties; substrates; surface morphology; surface roughness; tilt angle; tilt grain boundaries; transmission electron microscopy; transport properties; vicinal angles; vicinal offcut; Atomic force microscopy; Electrons; Grain boundaries; Microstructure; Rough surfaces; Spirals; Sputtering; Substrates; Surface morphology; Surface roughness;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.919884
  • Filename
    919884
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1478674