• DocumentCode
    1478711
  • Title

    Static Analysis of Register File Vulnerability

  • Author

    Lee, Jongeun ; Shrivastava, Aviral

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Ulsan Nat. Inst. of Sci. & Technol., Ulsan, South Korea
  • Volume
    30
  • Issue
    4
  • fYear
    2011
  • fDate
    4/1/2011 12:00:00 AM
  • Firstpage
    607
  • Lastpage
    616
  • Abstract
    With continuous technology scaling, soft errors are becoming an increasingly important design concern even for earth-bound applications. While compiler approaches have the potential to mitigate the effect of soft errors with minimal runtime overheads, static vulnerability estimation-an essential part of compiler approaches-is lacking due to its inherent complexity. This paper presents a static analysis approach for register file (RF) vulnerability estimation. We decompose the vulnerability of a register into intrinsic and conditional basic-block vulnerabilities. This decomposition allows us to develop a fast, yet reasonably accurate RF vulnerability estimation mechanism. We validate and compare a linear equation based method and an iterative method. Also we demonstrate a practical application of RF vulnerability estimation to compiler optimizations. Our experimental results on benchmarks from MiBench suite indicate that not only our static RF vulnerability estimation is fast and accurate, but also compiler optimizations enabled by our static estimation can achieve very cost-effective protection of register files against soft errors.
  • Keywords
    file organisation; iterative methods; program compilers; RF; earth bound applications; iterative method; linear equation based method; register file; register file vulnerability; soft errors; static analysis; technology scaling; Equations; Estimation; Hardware; Mathematical model; Optimization; Radio frequency; Registers; Architectural vulnerability factor; compilers; embedded systems; partially protected register file; soft error; static analysis;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2010.2095630
  • Filename
    5737851