Title :
Free-p: A Practical End-to-End Nonvolatile Memory Protection Mechanism
Author :
Yoon, Doe Hyun ; Muralimanohar, Naveen ; Chang, Jichuan ; Ranganathan, Parthasarathy ; Jouppi, Norman P. ; Erez, Mattan
Abstract :
Free-p-fine-grained remapping with error checking and correcting (ECC) and embedded pointers-remaps worn-out nonvolatile RAM (NVRAM) blocks at a fine granularity without requiring large dedicated storage and protects NVRAM against both hard and soft errors. Furthermore, Free-p can be implemented purely in the memory controller, avoiding custom NVRAM devices.
Keywords :
random-access storage; ECC; NVRAM; dedicated storage; error checking and correcting; free-p; hard errors; memory controller; nonvolatile RAM; practical end-to-end nonvolatile memory protection mechanism; soft errors; Error correction codes; Memory management; Nonvolatile memory; Phase change random access memory; Random access memory; Reliability; Resistance; error correction codes; memory; nonvolatile memory; phase-change random access memory; reliability; resistance;
Journal_Title :
Micro, IEEE
