DocumentCode :
1478822
Title :
Rate control for vacuum co-deposition of thin film cermets
Author :
Morris, J.E. ; Booth, A.D.
Author_Institution :
University of Saskatchewan, Department of Electrical Engineering, Saskatoon, Canada
Volume :
41
Issue :
4
fYear :
1971
fDate :
4/1/1971 12:00:00 AM
Firstpage :
163
Lastpage :
171
Abstract :
In vacuum co-deposition of thin cermet resistor films it has been found that the electrical properties are sensitive to deposition rates, thus needing a two-channel rate controller. The requirements of such an instrument are outlined and alternative systems are briefly compared, resulting in the choice of a digital data processor and step feedback control. A detailed description of the logic and circuit design of the instrument built is presented along with a brief discussion of the operational limitations and difficulties. Possible extensions of the instrument to other needs are considered.
Keywords :
electronic equipment manufacture; manufacturing processes; thickness control; thin film resistors; vacuum techniques; deposition rate control; logic circuit design; thin film cermets; thin film resistors; vacuum codeposition;
fLanguage :
English
Journal_Title :
Radio and Electronic Engineer
Publisher :
iet
ISSN :
0033-7722
Type :
jour
DOI :
10.1049/ree.1971.0054
Filename :
5268498
Link To Document :
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