DocumentCode :
1478944
Title :
Effect of Optical Phonon Scattering on the Performance of GaN Transistors
Author :
Fang, Tian ; Wang, Ronghua ; Xing, Huili ; Rajan, Siddharth ; Jena, Debdeep
Author_Institution :
Dept. of Electr. Eng., Univ. of Notre Dame, Notre Dame, IN, USA
Volume :
33
Issue :
5
fYear :
2012
fDate :
5/1/2012 12:00:00 AM
Firstpage :
709
Lastpage :
711
Abstract :
A model based on optical phonon scattering is developed to explain peculiarities in the current drive, transconductance, and high-speed behavior of short-gate-length GaN transistors. The model is able to resolve these peculiarities and provides a simple way to explain transistor behavior in any semiconductor material system in which electron-optical-phonon scattering is strong.
Keywords :
high electron mobility transistors; electron optical phonon scattering; high-speed transistor behavior; semiconductor material system; short gate length transistors; transconductance; Gallium nitride; HEMTs; Logic gates; Optical scattering; Phonons; ${f}_{T}$; high-electron-mobility transistor (HEMT); optical phonons; saturation current; scattering; transconductance;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2012.2187169
Filename :
6175101
Link To Document :
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