Title :
Numerical calculation of critical current in Bi-2223 stacked tapes
Author :
Nah, Wansoo ; Kang, Joonsun ; Choi, Seyong ; Park, Il-Han ; Joo, Jinho ; Kwon, Young-Kil ; Oh, Sang-Soo ; Ryu, Kang-Sik ; Paasi, Jaakko ; Lehtonen, Jorma
Author_Institution :
Sch. of Electr. & Comput. Eng., Sungkyunkwan Univ., Suwon, South Korea
fDate :
3/1/2001 12:00:00 AM
Abstract :
As we stack HTS tapes, the critical current of stacked tapes is much less than the total summation of the critical current of each tape. This is mainly due to self magnetic field effects, and its behavior has been analyzed by load line or numerical methods with some assumptions. In this paper, we propose a simple numerical model to calculate the critical current of stacked tapes more exactly. To do this, we measured Jc-B curves of a HTS tape for various values of external magnetic fields and the angles between the magnetic field and the tape surface. Using this experimental data, the current density distribution in the cross section of stacked tapes is calculated numerically and the results are compared to both experimental values and the ones from load line analysis method, calculated simply by assuming uniform current density across the tapes
Keywords :
bismuth compounds; calcium compounds; critical current density (superconductivity); high-temperature superconductors; strontium compounds; superconducting tapes; Bi-2223 stacked tapes; Bi2Sr2Ca2Cu3O10 ; critical current; current density distribution; high temperature superconductor; load line; numerical methods; self magnetic field effects; Critical current; Current density; Degradation; High temperature superconductors; Magnetic analysis; Magnetic field measurement; Magnetic fields; Numerical analysis; Numerical models; Stacking;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
