DocumentCode :
1479260
Title :
Design and Performance Evaluation of Radiation Hardened Latches for Nanoscale CMOS
Author :
Lin, Sheng ; Kim, Yong-Bin ; Lombardi, Fabrizio
Author_Institution :
Electr. & Comput. Eng. Dept., Northeastern Univ., Boston, MA, USA
Volume :
19
Issue :
7
fYear :
2011
fDate :
7/1/2011 12:00:00 AM
Firstpage :
1315
Lastpage :
1319
Abstract :
Deep sub-micrometer/nano CMOS circuits are more sensitive to externally induced radiation phenomena that are likely to cause the occurrence of so-called soft errors. Therefore, the tolerance of the circuit to the soft errors is a strict requirement in nanoscale circuit designs. Since the traditional error tolerant methods result in significant cost penalties in terms of power, area, and performance, the development of low-cost hardened designs for storage cells (such as latches and memories) is of increasing importance. This paper proposes three new hardened designs for CMOS latches at 32 nm feature size; these circuits are Schmitt trigger based, while the third one utilizes a cascode configuration in the feedback loop. The Cascode ST latch has 112% higher critical charge than the conventional reference latch with only 10% area increase. A novel design metric (QPAR) for latches is introduced to assess the overall design effectiveness such as area, performance, power, and soft error tolerance. The novel metric (QPAR) shows the proposed cascode ST latch achieves up to 36% improvement in terms of QPAR compared with the existing hardening designs. Monte Carlo analysis has confirmed the robustness of the proposed hardened latches to process, voltage, and temperature (PVT) variations.
Keywords :
CMOS integrated circuits; Monte Carlo methods; flip-flops; nanoelectronics; radiation hardening (electronics); Monte Carlo analysis; PVT variation; QPAR; cascode configuration; deep submicrometer CMOS circuit; nanoCMOS circuit; nanoscale CMOS; nanoscale circuit design; process-voltage-and-temperature variation; radiation hardened latches; size 32 nm; soft error; storage cells; CMOS memory circuits; Circuit synthesis; Costs; Feedback circuits; Feedback loop; Latches; Monte Carlo methods; Radiation hardening; Robustness; Trigger circuits; Circuit reliability; hardening latch; nanoscale CMOS; radiation hardening; robust design;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2010.2047954
Filename :
5454337
Link To Document :
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